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Types of Testing Techniques Used in VLSI Design
In VLSI design, various testing techniques are employed to ensure the functionality and reliability of integrated circuits. Some of the key types of testing techniques used in VLSI design include:
- BIST (Built-In Self-Test): BIST is a technique where circuitry is embedded within the chip to autonomously perform testing tasks without requiring external test equipment.
- ATPG (Automatic Test Pattern Generation): ATPG is a method used to automatically generate test patterns that help in detecting faults in the design.
- Scan Chain Testing: This technique involves the use of scan chains to facilitate the testing process by capturing and outputting test data through shift registers.
- Fault Simulation: Fault simulation is employed to analyze the behavior of the design under various fault conditions to validate its robustness.
These testing techniques play a crucial role in ensuring the quality and reliability of VLSI designs.
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